TRANSMISSION ELECTRON-MICROSCOPY INVESTIGATION OF BI-BASED HTS TAPES

Citation
Cj. Eastell et al., TRANSMISSION ELECTRON-MICROSCOPY INVESTIGATION OF BI-BASED HTS TAPES, IEEE transactions on applied superconductivity, 7(2), 1997, pp. 2083-2086
Citations number
9
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied
ISSN journal
10518223
Volume
7
Issue
2
Year of publication
1997
Part
2
Pages
2083 - 2086
Database
ISI
SICI code
1051-8223(1997)7:2<2083:TEIOBH>2.0.ZU;2-9
Abstract
Bi(Pb)-2223/Ag powder in tube tapes have been examined by TEM. The tap es show good alignment and phase purity in the SEM but TEM investigati ons revealed a number of fine-scale, current-limiting, features, Such features include variation in grain boundary structure, amorphous phas es at twist grain boundaries, residual 2212 layers present at grain bo undaries and inside grains, and secondary phases, The Ag/superconducto r interface has been shown to be relatively planar with no amorphous p hases with the Bi(Pb)-2223 having near perfect c-axis alignment at the interface.