DIELECTRIC FUNCTIONS OF COMMON YBCO SUBSTRATE MATERIALS DETERMINED BYSPECTROSCOPIC ELLIPSOMETRY

Reference dielectric function data for several common YBa2Cu3O7-delta (YBCO) substrate material shave been determined by spectroscopic ellip sometry over the range 250 nm - 750 nm. These materials include LaAlO3 , BaZrO3, NdGaO3, 9.5 mol% Y2O3-ZrO2 (YSZ), LaSrGaO4 (LSGO), and (LaAl O3)(0.3)-(Sr2AlTaO6)(0.7) (LSAT). The precision of the data was confir med by comparing SE determined data for SrTiO3 to published values. Ag reement to the third decimal point was shown. These data have been use d to characterize interfaces between YBCO and some of these materials by SE.