Structural modifications of the Gd2O3(110) films on GaAs(100)

Citation
C. Steiner et al., Structural modifications of the Gd2O3(110) films on GaAs(100), PHYS REV B, 62(16), 2000, pp. R10614-R10617
Citations number
13
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B
ISSN journal
01631829 → ACNP
Volume
62
Issue
16
Year of publication
2000
Pages
R10614 - R10617
Database
ISI
SICI code
0163-1829(20001015)62:16<R10614:SMOTGF>2.0.ZU;2-7
Abstract
We report an fee structure for the epitaxial Gd2O3 films grown on GaAs(100) . This fluorite-derived structure appears to be stabilized by epitaxy with the substrate and has a great similarity to the GaAs structure. A model cal culation supports this finding. Our secondary-electron imaging studies of t hese nanometer-thick films reveal that the films are cubic as deposited, an d this structure can be derived from the stable alpha -phase of the Gd2O3 b y a mild Ne+-ion bombardment and a subsequent anneal. These epitaxial Gd2O3 films have great importance because of their excellent surface passivation properties.