Ln. Kantorovich et al., Structure and spectroscopy of surface defects from scanning force microscopy: Theoretical predictions, PHYS REV L, 85(18), 2000, pp. 3846-3849
A possibility to study surface defects by combining noncontact scanning for
ce microscopy (SFM) imaging with atomically resolved optical spectroscopy i
s demonstrated by modeling an impurity Cr3+ ion at the MgO(001) surface wit
h a SFM rip. Using a combination of the atomistic simulation and the ab ini
tio electronic structure calculations, we predict a topographic noncontact
SFM image of the defect and show that its optical transitions can be either
enhanced or suppressed depending on the tip atomistic structure and its po
sition relative to the defect. These effects should allow identification of
certain impurity species through competition between radiative and nonradi
ative transitions.