Silicon nitride (SiN) fabricated by plasma-enhanced chemical vapour deposit
ion (PECVD) is increasingly used within the crystalline silicon (c-Si) phot
ovoltaic industry as it offers the possibility to fabricate a surface and b
ulk passivating antireflection coating at low temperature (less than or equ
al to 450 degreesC). This article presents an overview on the present statu
s of SIN for industrial as well as laboratory-type c-Si solar cells. Topics
covered include the fundamentals of the PECVD technology, the present stat
us of high-throughput PECVD machines for the deposition of SiN onto c-Si wa
fers, and a review of the fundamental properties of Si-SiN interfaces fabri
cated by PECVD. (C), 2001 Elsevier Science B.V. All rights reserved.