Non-coherent growth patches in pseudomorphic films: Unusual strain relief in electrodeposited Co on Cu(001)

Citation
W. Schindler et al., Non-coherent growth patches in pseudomorphic films: Unusual strain relief in electrodeposited Co on Cu(001), SURF SCI, 465(3), 2000, pp. L783-L788
Citations number
27
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
SURFACE SCIENCE
ISSN journal
00396028 → ACNP
Volume
465
Issue
3
Year of publication
2000
Pages
L783 - L788
Database
ISI
SICI code
0039-6028(20001020)465:3<L783:NGPIPF>2.0.ZU;2-5
Abstract
The critical thickness for pseudomorphic Co growth on Cu(001) is found to b e independent of the onset of lattice constant relaxation. The pseudomorphi c film relieves strain by local formation of orthomorphic growth patches wi thin the pseudomorphic matrix. This unusual relaxation mechanism of electro deposited films is in contrast to current belief of film relaxation. Moreov er, a tetragonal distortion of the fee Co unit cell in the orthomorphic gro wth regime indicates residual strain in films of up to at least 100 monolay ers thickness. (C) 2000 Elsevier Science B.V. All rights reserved.