W. Schindler et al., Non-coherent growth patches in pseudomorphic films: Unusual strain relief in electrodeposited Co on Cu(001), SURF SCI, 465(3), 2000, pp. L783-L788
The critical thickness for pseudomorphic Co growth on Cu(001) is found to b
e independent of the onset of lattice constant relaxation. The pseudomorphi
c film relieves strain by local formation of orthomorphic growth patches wi
thin the pseudomorphic matrix. This unusual relaxation mechanism of electro
deposited films is in contrast to current belief of film relaxation. Moreov
er, a tetragonal distortion of the fee Co unit cell in the orthomorphic gro
wth regime indicates residual strain in films of up to at least 100 monolay
ers thickness. (C) 2000 Elsevier Science B.V. All rights reserved.