Algorithm for analysis of low-energy-resolution REELS; determination of inelastic electron scattering cross-sections and applications in quantitativeXPS

Authors
Tougaard, S
Citation
S. Tougaard, Algorithm for analysis of low-energy-resolution REELS; determination of inelastic electron scattering cross-sections and applications in quantitativeXPS, SURF SCI, 464(2-3), 2000, pp. 233-239
Citations number
12
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
SURFACE SCIENCE
ISSN journal
00396028 → ACNP
Volume
464
Issue
2-3
Year of publication
2000
Pages
233 - 239
Database
ISI
SICI code
0039-6028(20001001)464:2-3<233:AFAOLR>2.0.ZU;2-M
Abstract
We present a simple algorithm for separation of elastic and inelastic elect rons in low-energy-resolution REELS and for subsequent determination of the differential inelastic electron scattering cross-section. The application of the determined cross-sections for quantitative surface analysis and back ground correction with XPS is discussed. (C) 2000 Elsevier Science B.V. All rights reserved.