The effect of microstructure and interface conditions on the exchange coupling fields of NiFe/FeMn

Citation
Zq. Lu et al., The effect of microstructure and interface conditions on the exchange coupling fields of NiFe/FeMn, THIN SOL FI, 375(1-2), 2000, pp. 224-227
Citations number
7
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
THIN SOLID FILMS
ISSN journal
00406090 → ACNP
Volume
375
Issue
1-2
Year of publication
2000
Pages
224 - 227
Database
ISI
SICI code
0040-6090(20001031)375:1-2<224:TEOMAI>2.0.ZU;2-E
Abstract
The effect of microstructure and interface conditions on the exchange coupl ing field H-ex and coercivity H-c of NiFe/FeMn systems was investigated. Th e results show that the exchange coupling was dependent on [111] crystal or ientation and interface roughness as well as the grain size of FeMn. The hi gh H-ex (approximate to 120 Oe) and low H-c (approximate to 5 Oe) of the pi nned NiFe layer was achieved by a two-step deposition procedure. The down s ublayers were deposited at a lower argon pressure, and the upper sublayers were deposited at a higher argon pressure. The former promoted the formatio n of the strong (111) textures and smooth interfaces. The latter promoted s mall domains and sharp interfaces. (C) 2000 Elsevier Science S.A. All right s reserved.