K. Obara et al., Angle dependence of transmission probability of incident electrons into thin oxide films and noise spectra, THIN SOL FI, 375(1-2), 2000, pp. 275-279
We present the wave number vector dependence of transmission current and no
ise spectra which was generated by the transition of electrons from vacuum
to thin oxide films on metal electrodes. The transmission probability of an
incident electron consists of three factors: (1) probability from vacuum t
o the surface electronic states on the oxide film; (2) probability from the
oxide film to the metal substrate; and (3) probability of the direct trans
ition from vacuum to the metal substrate. The noise spectra were proportion
al to the duration of the electron hopping, which contained two types of wa
ve number dependence. One was spot-type-noises, which were related to the l
attice defects, and another was smoothly distributed noise which suggested
randomly distributed surface defects. (C) 2000 Elsevier Science S.A. All ri
ghts reserved.