The behavior of detector-grade Cd0.9Zn0.1Te in a radiation-hostile environm
ent has been investigated by studying the effects on the material defective
states induced by gamma irradiation. The detector performance is strongly
affected by the presence of charge-trapping centers which may also interven
e in the material compensation properties. We have investigated by photoind
uced current transient spectroscopy analyses the evolution with increasing
irradiation dose of the deep levels both present in the as-grown material a
nd induced by the ionizing radiation. A significant correlation between the
material resistivity and some deep levels behavior has been observed. We h
ave compared this trend to the results obtained from gamma -irradiated CdTe
:Cl to better understand the role deep traps play in the compensation proce
ss of II-VI materials. (C) 2000 American Institute of Physics. [S0003-6951(
00)00146-7].