We describe a Full Multiple Scattering (MS) code for the calculation of pho
toelectron diffraction (PD) patterns from solid surfaces. The use of a comp
lex potential allows the calculation of complex phase shifts which describe
realistically the damping of the electronic wave during its path to the de
tector. Full convergence in the scattering path expansion due to the invers
ion of the multiple scattering matrix makes this method particularly reliab
le in the surface sensitive energy range of the photoelectron, where approx
imate solutions in terms of series expansion and/or real potential calculat
ions lead to inaccuracies in the determination of structural parameters. In
this form the code is suitable to applications to clean surfaces such as S
urface Core Level Shift Photoelectron Diffraction (SCLS-PD). (C) 2000 Elsev
ier Science B.V. All rights reserved.