N. Otsuka et al., Room temperature 339 nm emission from Al0.13Ga0.87N/Al0.10Ga0.90N double heterostructure light-emitting diode on sapphire substrate, JPN J A P 2, 39(5B), 2000, pp. L445-L448
Room-temperature deep-ultraviolet emission has been observed from Al0.13Ga0
.87N/Al0.10Ga0.90N double heterostructure tight-emitting diodes (LEDs) on (
0001)-oriented sapphire substrate. By introducing undoped barrier layers, w
hich sandwich the active layer, the LED was operated at a peak emission wav
elength of 339 nm with a narrow linewidth of 5.6 nm. The dependence of emis
sion intensity on injection current suggests that the nonradiative recombin
ation was suppressed and the diffusion current for the recombination proces
s was dominant at the injection current of over 20 mA.