Effects of process parameters on the soldering behavior of the eutectic Sn-Zn solder on Cu substrate

Citation
Sp. Yu et al., Effects of process parameters on the soldering behavior of the eutectic Sn-Zn solder on Cu substrate, J MAT S-M E, 11(6), 2000, pp. 461-471
Citations number
17
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
ISSN journal
09574522 → ACNP
Volume
11
Issue
6
Year of publication
2000
Pages
461 - 471
Database
ISI
SICI code
0957-4522(200008)11:6<461:EOPPOT>2.0.ZU;2-1
Abstract
The effects of process parameters such as flux, dipping temperature and the heat-treatment on the soldering behaviors of the eutectic solder (composit ion: 91Sn-9Zn) hot-dipped on Cu substrates were investigated. The most suit able flux as tested was oleic acid for the eutectic Sn-Zn solder system hot -dipped on Cu substrate for the solder coverage. The adhesion strength obta ined increased from 9.6 +/-0.6 MPa to 11.9 +/-0.6 MPa when the dipping temp erature increased from 250 degreesC to 300 degreesC. However, it decreased from 11.9 +/-0.6 MPa to 5.2 +/-2.2 MPa as the sample was heated at 150 degr eesC for 1200 h. Planar gamma- Cu5Zn8 isolate-shaped eta -Cu6Sn5 intermetal lic layers were found in the bulk sample after heating at 150 degreesC for 300 h but was not found in the as-cast sample. In the plate samples, scallo p-shaped gamma -Cu5Zn8/inverted trigonal-shaped eta -Cu6Sn5 intermetallic l ayers were found after heating at 150 degreesC for 600 h. Some pores were f ound at the interface between gamma -Cu5Zn8 intermetallic compound (IMC) an d the solder alloy, which might come from the formation and growth of IMCs and decreased the adhesion strength. (C) 2000 Kluwer Academic Publishers.