Electrical, structural, morphological and optical characteristics of ZnO:Al
thin films obtained by chemical spray are presented in this paper. The dep
endence of the resistivity on the substrate temperature and the film thickn
ess is reported. For the optimized conditions with no post-annealing the lo
west resistivity values obtained for ZnO:Al thin films were 3 X 10(-3) and
1.4 X 10(-2)omega cm for films with thicknesses of 1500 and 600 nm, respect
ively. Preferential growth in the (0 0 2) direction was observed in all cas
es. The surface morphology was analyzed by using atomic force and scanning
electron microscopy (AFM and SEM) techniques. High transmittance, 85%, was
obtained in all cases. The band gap was of the order of 3.35 eV.