A. Kortyna et al., High-resolution study of xenon autoionization using direct vacuum-ultraviolet laser excitation, J OPT SOC B, 17(11), 2000, pp. 1934-1942
A new, direct vacuum-ultraviolet laser-excitation method is used to study t
he single-photon autoionization of xenon atoms in the 5p(6) --> 5p(5) ns'[1
/2](1)(0) (14 less than or equal to n less than or equal to 52) and 5p(6) -
-> 5p(5) nd'[3/2](1)(0) (16 less than or equal to n less than or equal to 7
8) autoionizing Rydberg series. Fano profile parameters for both series are
reported over the entire range of observed states. From analysis of the nd
' series an ionization potential T-d = 108 370.82 +/- 0.05 cm(-1) is obtain
ed. This agrees well with a previously reported limit of 108 370.8 +/- 0.2
cm(-1). (C) 2000 Optical Society of America [S0740-3224(00)00111-9].