High-resolution study of xenon autoionization using direct vacuum-ultraviolet laser excitation

Citation
A. Kortyna et al., High-resolution study of xenon autoionization using direct vacuum-ultraviolet laser excitation, J OPT SOC B, 17(11), 2000, pp. 1934-1942
Citations number
43
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS
ISSN journal
07403224 → ACNP
Volume
17
Issue
11
Year of publication
2000
Pages
1934 - 1942
Database
ISI
SICI code
0740-3224(200011)17:11<1934:HSOXAU>2.0.ZU;2-I
Abstract
A new, direct vacuum-ultraviolet laser-excitation method is used to study t he single-photon autoionization of xenon atoms in the 5p(6) --> 5p(5) ns'[1 /2](1)(0) (14 less than or equal to n less than or equal to 52) and 5p(6) - -> 5p(5) nd'[3/2](1)(0) (16 less than or equal to n less than or equal to 7 8) autoionizing Rydberg series. Fano profile parameters for both series are reported over the entire range of observed states. From analysis of the nd ' series an ionization potential T-d = 108 370.82 +/- 0.05 cm(-1) is obtain ed. This agrees well with a previously reported limit of 108 370.8 +/- 0.2 cm(-1). (C) 2000 Optical Society of America [S0740-3224(00)00111-9].