Simulation of particle-induced electron emission in aluminum and copper

A Monte-Carlo computer code for the simulation of particle transport in met allic solids has been developed. Electrons or bare ion projectiles can be u sed. The code is able to calculate a wide variety of phenomena such as elec tronic energy loss, electronic energy loss straggling, particle-induced yie ld of emitted electrons or the statistical distribution of the number of em itted electrons per incident projectile. The theoretical models used in the simulation partially follow the basic work of Ganachaud and Cailler. Howev er, for the loosely bound outer electrons of copper, the classical model of core ionization as it has been used by previous authors breaks down. There fore, a fully quantum-mechanical description has been used in this work. Fo r aluminum and copper the simulation results are compared with experimental and theoretical data. Excellent agreement is found. (C) 2000 Elsevier Scie nce B.V. All rights reserved.