Early stages of ITO deposition on glass or polymer substrates

Citation
Y. Shigesato et al., Early stages of ITO deposition on glass or polymer substrates, VACUUM, 59(2-3), 2000, pp. 614-621
Citations number
7
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
VACUUM
ISSN journal
0042207X → ACNP
Volume
59
Issue
2-3
Year of publication
2000
Pages
614 - 621
Database
ISI
SICI code
0042-207X(200011/12)59:2-3<614:ESOIDO>2.0.ZU;2-#
Abstract
Early stages of Sn-doped In2O3 (ITO) film deposition on room room temperatu re (RT) acrylic-coated polycarbonate (PC) substrates using de magnetron spu ttering were investigated, by comparing them with those on RT soda-lime gla sses. The microstructures and electrical properties of the films were analy zed as they grew from 1 to 330 nm. The ITO/glass had conductivity when the thickness was larger than 4 nm, whereas the ITO/PC had conductivity at a th ickness larger than 14 nm, and became constant at about 21 nm. According ro a result obtained by AFM, average roughness (R-a) of the ITO/glass surface showed remarkable change with increasing thickness reflecting initial nucl eation, coalescence and continuous him growth processes, i.e. Volmer-Weber- type initial growth. Whereas, in the case of ITO/PC, R-a, was almost consta nt, except for the peak caused by substrate damage at a thickness smaller t han 4 nm. (C) 2000 Elsevier Science Ltd. All rights reserved.