HIGH-RESOLUTION ANGULAR AND DISPLACEMENT SENSING BASED ON THE EXCITATION OF SURFACE PLASMA-WAVES

Citation
G. Margheri et al., HIGH-RESOLUTION ANGULAR AND DISPLACEMENT SENSING BASED ON THE EXCITATION OF SURFACE PLASMA-WAVES, Applied optics, 36(19), 1997, pp. 4521-4525
Citations number
19
Categorie Soggetti
Optics
Journal title
ISSN journal
00036935
Volume
36
Issue
19
Year of publication
1997
Pages
4521 - 4525
Database
ISI
SICI code
0003-6935(1997)36:19<4521:HAADSB>2.0.ZU;2-R
Abstract
The possibility of building angular and displacement sensors based on the phenomenon of attenuated total reflection (ATR) is explored both n umerically and experimentally. ATR occurs when a surface wave is excit ed by an incoming TM electromagnetic wave through a resonant phase-mat ching process, as in the Kretschmann coupling scheme. The reflected in tensity strongly depends on the angle of incidence of the beam. We fir st show some computations of the sensitivity and the linearity of an A TR-based sensor, then proceed to the experiment, illustrating how an a ngular resolution of the order of 0.1 are sec can be obtained with mod erate effort. Finally me show how the sensor, combined with a simple o ptical arrangement, can be used to detect and measure nanometric displ acements, as those provided by piezoelectric actuators. (C) 1997 Optic al Society of America.