M. Beerbom et al., XPS analysis of wet chemical etching of GaAs(110) by Br-2-H2O: comparison of emersion and model experiments, ELECTR ACT, 45(28), 2000, pp. 4663-4672
We have applied photoelectron spectroscopy to investigate the surface compo
sition after different surface treatments involving Br-2-H2O mixtures in or
der to study wet chemical etching. Emersion experiments from Br-2.H2O solut
ion are compared with model experiments, in which Br-2-H2O adsorbate and co
adsorbate mixtures react with clean GaAs(110) surfaces. Our results indicat
e that Ga- and As-bromides formed initially are hydrolyzed to form the resp
ective oxides. Without addition of Br-2, only slight oxidation of the surfa
ce takes place, There is an enrichment of Ga due to loss of As both in adso
rption as well as in emersion experiments. Since in emersion experiments on
ly a final situation is analyzed, the relative influence of surface reactiv
ity and subsequent solvation effects cannot be distinguished easily, while
model experiments give clear information on reaction products formed interm
ediately. However, model experiments differ in environment and temperature
from the real solid-liquid interface. The presented results demonstrate tha
t a combination of emersion and model experiments provide valuable insight
into the mechanism of wet chemical etching on a microscopic level. (C) 2000
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