The effects of pyrolysis and annealing conditions on the orientation of PZT
thin films prepared by Sol-Gel process have been investigated. The influen
ce of the interface behaves between Ti and Pt Formed at different heat trea
tment conditions on orientation of final PZT thin films was emphasized in t
his paper. The relationship between thermal treatment and orientation in PZ
T thin films fabricated by the technique was set up, and the optimum therma
l process was determined. PZT films on the (111)Pt/Ti/SiO2/Si using such pr
ocess exhibited good ferroelectric properties.