Fine structures appearing in boron nitride(BN) sample bomparded by N-2(+) i
on (60keV) were examined by JEM-200cx high-resolution transmission electron
microscopy (HRTEM) at 200kV accelerating voltage. In the curved region of
plate-like h-BN crystal sp(2) sheets (spacing 0.33nm), it was observed that
the t-BN structure with an average inter-planer spacing of 0.35 nm was for
med. Although the mechanism of formation of the t-BN structure is unclear,
it appears that our discussion based on the viewpoint of beam-solid interac
tion may be critical in understanding the growth process of the t-BN struct
ures.