Sk. Bhattacharya et al., Low-cost large area processing using small area substrates - A novel multitiled palletization concept for MCM-D thin film process, IEEE T AD P, 23(4), 2000, pp. 661-671
Multichip module-deposited (MCM-D) has been the solution for integrated hig
h density packaging due to its superior line resolution and higher inputs/o
utputs (I/O) density compared to MCM-C and multichip module-laminate (MCM-L
) technologies, However, the consumer demand for high performance products
at reduced costs is ever increasing, and this trend is expected to continue
in the 21st Century, In order to find a low-cost solution for future MCM-D
packaging, a novel palletization process which incorporates several tiles
(alumina or silicon) on a large carrier glass (pallet) has been established
in this study, The multitiling format provides simultaneous processing of
several small tiles onto a re-usable CTE matched carrier glass. The tiles a
re attached to the glass with a low modulus adhesive that can be released a
t an elevated temperature (similar to 450 degreesC) The objective of this s
tudy is to develop a multitiling process for a 300 mm x 300 mm area that is
scalable up to 600 mm x 600 mm format. There are several challenges in rea
lization of the large area palletization approach, such as formulation and
qualification of a high temperature reworkable adhesive and minimization of
out-of-plane warpage of the tiled assembly, Finite element models for warp
age and its validation by Shadow Moire measurement, formulation of a compli
ant adhesive for thermal stability up to 400 degreesC are reported in previ
ous publications. This paper deals with 1) the validation of the palletizat
ion concept on a 300 mm x 300 mm glass with weight restriction below 3 Ibs
and thickness limitation to <6.25 mm, and 2) qualification of the formulate
d adhesive through a correlative study on high temperature detachability of
the attached tiles, chemical compatibility of the adhesive with acids, bas
es, and less polar solvents, and interfacial shear strength at the lass/adh
esive/tile joints. MCM-D thin film process on the tiled substrates is to be
conducted by the member companies of the MCM-D Consortium.