Yl. Hao et al., Atom location by channeling enhanced microanalysis study of site distributions of alloying elements in titanium aluminides, J MATER RES, 15(11), 2000, pp. 2475-2481
The original equation of Spence and Tafto for quantitative determination of
site occupancy using atom location by channeling enhanced microanalysis me
thod has been extended to take into account both delocalization effect and
the influence of point defects (antisite atomic distribution and vacancies)
. The outcome of this treatment suggests that, for crystals free of antisit
e defects, the accuracy of site occupancy is influenced by delocalization e
ffect but is independent of both thermal and structural vacancies. For crys
tals free of structural vacancies, the accuracy of site occupancy is influe
nced by both delocalization effect and antisite defects, but is independent
of thermal vacancies. The delocalization effect was shown to vary with cha
nneling strength at a given channeling condition. For a binary ordered phas
e in which at least one of the host elements exhibits weak delocalization e
ffect las is the case for many transition-metal aluminides), a tangent-line
method for obtaining the value of k (a parameter necessary for the calcula
tion of site occupancy) was proposed, allowing the determination of the del
ocalization correction factor for the other host element. Application of th
is method to estimating the delocalization effect of Al in Ti3Al and TiAl u
nder axial and planar channeling conditions, respectively, was demonstrated
.