Spectroscopic characterization of the bonding, orientation, and coverage of copper tetraazaphthalocyanine monolayer films on SiO2 surfaces

Citation
K. Oberg et al., Spectroscopic characterization of the bonding, orientation, and coverage of copper tetraazaphthalocyanine monolayer films on SiO2 surfaces, J PHYS CH B, 104(45), 2000, pp. 10627-10634
Citations number
40
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF PHYSICAL CHEMISTRY B
ISSN journal
15206106 → ACNP
Volume
104
Issue
45
Year of publication
2000
Pages
10627 - 10634
Database
ISI
SICI code
1520-6106(20001116)104:45<10627:SCOTBO>2.0.ZU;2-M
Abstract
Self-assembled monolayer films of a metallotetraazaphthalocyanine were prep ared using two different reaction conditions. The films were characterized by ellipsometry, AFM, electronic absorption spectroscopy, semiempirical MO calculations, core-level XPS, and projection of a calculated structure of t he chromophore onto a surface to obtain its silhouette area for comparison with surface concentration from absorption spectroscopy. A denser packing o f the chromophores is found in the SAM film prepared with bromonaphthalene at 250 degreesC as compared with the film from the more polar solvent DMF a t 120 degreesC. Data is consistent with an almost vertical orientation of t he chromophores in the former film. A different number of bonds connecting the chromophore with the coupling molecule is suggested as an explanation t o differences in the absorption bands for the two films.