The effects of Si incorporation on the microstructure and nanomechanical properties of DLC thin films

Citation
Jf. Zhao et al., The effects of Si incorporation on the microstructure and nanomechanical properties of DLC thin films, J PHYS-COND, 12(44), 2000, pp. 9201-9213
Citations number
27
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF PHYSICS-CONDENSED MATTER
ISSN journal
09538984 → ACNP
Volume
12
Issue
44
Year of publication
2000
Pages
9201 - 9213
Database
ISI
SICI code
0953-8984(20001106)12:44<9201:TEOSIO>2.0.ZU;2-O
Abstract
A small amount of silicon incorporation into diamond-like carbon (DLC) film s prepared by plasma-enhanced chemical vapour deposition (PECVD) onto Al2O3 :TiC substrates was studied by a combination of surface analysis and nanom echanical measurement techniques, namely XPS, Raman spectroscopy, nanoinden tation and nanoscratch methods. Addition of silicon to the DLC films leads to an increase in the fraction of sp(3), as deduced from XPS analysis, and a decrease in the Raman band intensity ratio 1(D)/1(G). Although the coated substrates exhibit better scratch resistance and lubricity, the films as d eposited are softer than the Al2O3:TiC substrates. Upon silicon incorporati on, the mechanical and tribological properties are degraded. Wear protectio n of the Al2O3:TiC substrate by DLC coating corresponds to the competition between the reduction in friction coefficient and the softening of the film s. It is suggested that, for such a PECVD process, the degradation of the m echanical properties is caused by the increased hydrogen content in the dep osits when silicon is incorporated, as is shown by the increased Raman spec tral background slope. These tendencies are attributable to the development of polymer-like chains, which can weaken the inter-molecular structure of the films.