R. Checchetto et al., Structure and optical properties of boron nitride thin films deposited by radio-frequency sputtering on polycarbonate, J PHYS-COND, 12(44), 2000, pp. 9215-9220
Thin optical protective coatings of boron nitride, similar to1 mum thick, w
ere deposited at low substrate temperature on polycarbonate (PC) and fused
silica substrates by r.f. magnetron sputtering using a mixture of Ar + N-2
as the sputtering gas. The structure and composition of the deposited layer
s were studied by Fourier transform infrared spectroscopy (FTIR) and Ruther
ford backscattering spectroscopy (RBS). The optical characterization of the
coated sample was carried out by measuring the ultraviolet-visible transmi
ttance at different wavelengths and the strength of adhesion of the deposit
ed layers to the plastic substrate was analysed by a scratch test. The depo
sited layers grow with hexagonal structure, the resulting layers being near
ly stoichiometric, and are highly transparent in the visible range on both
substrates examined; the measured optical band-gap of the coating was 4.6 /- 0.1 eV. The strength of adhesion to the polycarbonate was found to be de
pendent on the substrate pre-deposition treatment: ion etching of the PC su
rface before coating deposition gives rise to films with good adherence as
a consequence of the formation of a mixed interface layer where C=N chemica
l bonds were observed by FTIR.