Evolution of the surface roughness (dynamic scaling) and microstructure ofsputter-deposited Ag75Co25 granular films

X-ray specular-reflectivity measurements have been carried out on Ag75Co25 granular films which were sputter-deposited on Si substrates with SiO2 surf ace, to investigate the evolution of surface roughness as a function of fil m thickness. X-ray reflectivity data were recorded for thicknesses of Ag75C o25 thin films ranging from 8.8-116.9 nm. A power law behaviour of the inte rfacial width of a growing interface in sputtered-deposited Ag75Co25 granul ar films was observed. The scaling exponent was found to be beta = 0.43 +/- 0.01 and compared with theoretical calculations. High resolution electron microscopy revealed the presence of crystalline particles of fee Ag and hcp Co. The structural and magnetoresistive properties of the films are discus sed.