Amorphous SiO2 was implanted with Si+ and Au2+ ions at energies of 4 and 3
MeV, respectively. The doses ranged from 0.3 x 10(17) to 1.5 x 10(17) ions
cm(-2), and a current density of 30 muA cm(-2) was used. The formation of E
' and B-2 centers was observed for both ions by optical absorption and elec
tron paramagnetic resonance (for E' defects) measurements. For Si implantat
ion, there is a saturation of E'-center formation for doses higher than 1.0
x 10(17) Si cm(-2); Au implantation produces E'-center annealing for suffi
ciently high doses. The heating effect due to the relatively high current d
ensity induces spontaneous formation of Au nanoparticles already during the
ion bombardment. The effect of subsequent thermal annealing in a reducing
atmosphere at 600 and 900 degreesC on the E' and B-2 centers was also studi
ed. (C) 2000 Elsevier Science S.A. All rights reserved.