The peaks in the electric derivative curves and optic derivative curves ofGaAs/GaAlAs high-power QW lasers

Citation
Ly. Qi et al., The peaks in the electric derivative curves and optic derivative curves ofGaAs/GaAlAs high-power QW lasers, MICROEL REL, 40(12), 2000, pp. 2123-2128
Citations number
11
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
MICROELECTRONICS RELIABILITY
ISSN journal
00262714 → ACNP
Volume
40
Issue
12
Year of publication
2000
Pages
2123 - 2128
Database
ISI
SICI code
0026-2714(200012)40:12<2123:TPITED>2.0.ZU;2-D
Abstract
The technique of electric derivative measurement can be used for the simple screening of quickly degraded semiconductor lasers. The peaks in electric derivative (I dV/dI - I) and optic derivative curves (dP/dI - I) of GaAs/Ca AlAs high-power QW lasers have been investigated. The presence of peaks was used to judge the reliability and quality of devices. (C) 2000 Elsevier Sc ience Ltd. All rights reserved.