The surface morphology and the room temperature 1.54 mum photoluminescence
(PL) intensity from GaN:Er grown by gas source molecular beam epitaxy have
been investigated as a function of C concentration as introduced by CBr4. S
imilar to previous results with increasing Er level, increasing the C conce
ntration initially improved the surface smoothness as measured by atomic fo
rce microscopy (AFM) and scanning electron microscopy (SEM), with RMS rough
ness improving by a factor of seven over undoped GaN. The PL also improved
dramatically. However, the highest amounts of C investigated produced a dec
rease in the PL as well as a roughening of the film surface. These effects
indicate that the GaN:Er had reached its C solubility limit, producing an i
ncreased amount of defect induced nonradiative recombination.