ROBUST SUPERCONDUCTING DIE ATTACH PROCESS

Citation
Ke. Yokoyama et al., ROBUST SUPERCONDUCTING DIE ATTACH PROCESS, IEEE transactions on applied superconductivity, 7(2), 1997, pp. 2631-2634
Citations number
5
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied
ISSN journal
10518223
Volume
7
Issue
2
Year of publication
1997
Part
3
Pages
2631 - 2634
Database
ISI
SICI code
1051-8223(1997)7:2<2631:RSDAP>2.0.ZU;2-3
Abstract
As complexity of superconducting digital systems increase, the need fo r multi-chip modules and a reliable, high bandwidth attachment scheme for superconducting die becomes more and more critical. We have develo ped a flip chip die attach process for Low Temperature Superconducting (LTS) chips using InSn reflow soldering. Using standard reflow techni ques, we create highly reproducible, uniform 14 micron-high solder bum ps on gold-defined pad regions. Subsequent alignment, compression, and reflow soldering produce reliable, low inductance connections with hi gh yield. The short interconnect distance of 5-7 mu m results in low e nough inductance to support multi-GHz chip interconnect at low impedan ce. We have successfully tested and thermally cycled flip chipped die over many temperature cycles to liquid helium temperatures with no fai lures. We will report on successful attachment, testing, and rework of superconducting circuit chips. Specifically, we present data on solde r bump uniformity, yield, electrical and thermal characteristics, rewo rkability, and reliability under repeated thermal cycling.(i)