Development of a reliable flipped chip mounting technique enables demo
nstration of high speed, complex digital circuits, Flip chip mounting
has greatly reduced parasitic inductance compared to conventional wire
bonding, and permits remounting of known good die onto multi-chip mod
ules, Superconductive digital circuits have operated to 4.3 Gb/s in ou
r custom test station, The circuit and carrier are fabricated using TR
W's foundry process, The chips are flipped onto a superconducting copl
anar carrier using a low temperature solder reflow process reported on
at this conference, Testing is performed in a multi-GHz, flip contact
, variable temperature probe, This test facility is capable of testing
circuits to 12 Gb/s, We will describe the operation and performance o
f our circuits at high bit rates, and design improvements intended to
facilitate operation at higher bit rates with improved yield, In addit
ion, we will discuss the use of a logic simulation tool to analyze the
output words, and pinpoint the gate or gates that failed to operate p
roperly.