MULTI-GB S OPERATION OF FLIPPED CHIP MVTL CIRCUITS/

Citation
Bj. Dalrymple et al., MULTI-GB S OPERATION OF FLIPPED CHIP MVTL CIRCUITS/, IEEE transactions on applied superconductivity, 7(2), 1997, pp. 2693-2696
Citations number
4
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied
ISSN journal
10518223
Volume
7
Issue
2
Year of publication
1997
Part
3
Pages
2693 - 2696
Database
ISI
SICI code
1051-8223(1997)7:2<2693:MSOOFC>2.0.ZU;2-7
Abstract
Development of a reliable flipped chip mounting technique enables demo nstration of high speed, complex digital circuits, Flip chip mounting has greatly reduced parasitic inductance compared to conventional wire bonding, and permits remounting of known good die onto multi-chip mod ules, Superconductive digital circuits have operated to 4.3 Gb/s in ou r custom test station, The circuit and carrier are fabricated using TR W's foundry process, The chips are flipped onto a superconducting copl anar carrier using a low temperature solder reflow process reported on at this conference, Testing is performed in a multi-GHz, flip contact , variable temperature probe, This test facility is capable of testing circuits to 12 Gb/s, We will describe the operation and performance o f our circuits at high bit rates, and design improvements intended to facilitate operation at higher bit rates with improved yield, In addit ion, we will discuss the use of a logic simulation tool to analyze the output words, and pinpoint the gate or gates that failed to operate p roperly.