Combined infrared absorption and modeling study of a dicarbon-dihydrogen defect in silicon

Citation
Ev. Lavrov et al., Combined infrared absorption and modeling study of a dicarbon-dihydrogen defect in silicon, PHYS REV B, 62(19), 2000, pp. 12859-12867
Citations number
29
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B
ISSN journal
01631829 → ACNP
Volume
62
Issue
19
Year of publication
2000
Pages
12859 - 12867
Database
ISI
SICI code
0163-1829(20001115)62:19<12859:CIAAMS>2.0.ZU;2-T
Abstract
Crystalline silicon samples doped with carbon were irradiated with electron s and subsequently implanted with protons. infrared-absorption measurements revealed local modes of hydrogen and carbon at 2967.4, 911.7, and 654.7 cm (-1), which originate from the same defect. Measurements on samples codoped with different carbon and hydrogen isotopes showed that the defect contain s two equivalent carbon and two equivalent hydrogen atoms. From uniaxial st ress measurements, the defect is found to display trigonal symmetry. Ab ini tio local-density-functional theory was applied to calculate the structure and local vibrational modes of defects with pairs of equivalent carbon and hydrogen atoms. Based on these results, the observed local modes are ascrib ed to a defect with two adjacent substitutional carbon atoms, each of which binds a hydrogen atom located between the carbon atoms.