RESONANT CHARACTERISTICS OF HIGH T-C DC SQUID CAUSED BY LARGE DIELECTRIC-CONSTANT OF SRTIO3

Citation
K. Enpuku et al., RESONANT CHARACTERISTICS OF HIGH T-C DC SQUID CAUSED BY LARGE DIELECTRIC-CONSTANT OF SRTIO3, IEEE transactions on applied superconductivity, 7(2), 1997, pp. 3355-3358
Citations number
7
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied
ISSN journal
10518223
Volume
7
Issue
2
Year of publication
1997
Part
3
Pages
3355 - 3358
Database
ISI
SICI code
1051-8223(1997)7:2<3355:RCOHTD>2.0.ZU;2-R
Abstract
Dynamic behavior of de SQUID coupled to resonant circuit is studied wi th numerical simulation. It is shown that large rf noise flux is cause d by the resonant circuit, and is added to the SQUID, This rf flux aff ects considerably the SQUID characteristics, e.g., appearance of reson ant behavior and the increase of noise. It is also shown that a parasi tic capacitance between the resonant circuit and the ground of the SQU ID changes the SQUID characteristics. Therefore, it is important to su ppress the rf noise flux and decrease the parasitic capacitance in ord er to improve the characteristics of the coupled SQUID.