K. Enpuku et al., RESONANT CHARACTERISTICS OF HIGH T-C DC SQUID CAUSED BY LARGE DIELECTRIC-CONSTANT OF SRTIO3, IEEE transactions on applied superconductivity, 7(2), 1997, pp. 3355-3358
Dynamic behavior of de SQUID coupled to resonant circuit is studied wi
th numerical simulation. It is shown that large rf noise flux is cause
d by the resonant circuit, and is added to the SQUID, This rf flux aff
ects considerably the SQUID characteristics, e.g., appearance of reson
ant behavior and the increase of noise. It is also shown that a parasi
tic capacitance between the resonant circuit and the ground of the SQU
ID changes the SQUID characteristics. Therefore, it is important to su
ppress the rf noise flux and decrease the parasitic capacitance in ord
er to improve the characteristics of the coupled SQUID.