The dielectric response of c-axis oriented La2-xSrxCuO4 film is experi
mentally studied using Pd/La2-xSrxCuO4/(100)SrTiO3/Pd multi-layer stru
cture. Anomalous capacitance increase is observed at Sr doping level x
approximate to 1/2(n) where the drop of resistivity Tn bulk La2-xSrxC
uO4 in normal state has been reported.