Solid immersion microscopy, similar to liquid immersion microscopy, extends
the diffraction limit by filling the object space with a high refractive i
ndex material, such as glass (index of refraction n = 1.5-2), sapphire (n s
imilar to 1.8), and semiconductor materials (n similar to 3), which Shrink
the wavelength of light. Bur solid immersion technique achieve significantl
y higher spatial resolution since the refractive indices of available solid
s can be much higher than those of liquids (n = 1.3-1.5). Besides high spat
ial resolution, solid immersion microscopy also possesses all the good prop
erties of far-field imaging, such as high transmission efficiency and paral
lel imaging capability, which make it outstanding among beyond-the-diffract
ion-limit optical imaging techniques. In this paper we discuss, from an exp
erimental point of view, the resolution limit of solid immersion microscopy
and the implementation of such technique in various applications.