XPS comparison between nanocrystalline gamma-alumina and a new high pressure polymorph

Citation
Ce. Moffitt et al., XPS comparison between nanocrystalline gamma-alumina and a new high pressure polymorph, SOL ST COMM, 116(11), 2000, pp. 631-636
Citations number
12
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
SOLID STATE COMMUNICATIONS
ISSN journal
00381098 → ACNP
Volume
116
Issue
11
Year of publication
2000
Pages
631 - 636
Database
ISI
SICI code
0038-1098(2000)116:11<631:XCBNGA>2.0.ZU;2-I
Abstract
High surface area, nano-phase materials exhibit many interesting properties quite different from their bulk counterparts, and are the focus of much te chnical investigation and engineering development based on these properties . Earlier experiments using X-ray diffraction have indicated that a new pha se of alumina exists upon non-hydrostatic compression of 67 nm particles of gamma -alumina to above 35 GPa and quasi-hydrostatic compression to pressu res over 50 GPa. This phase is quenchable on decompression to 0 GPa, allowi ng for additional analysis that are unmanageable in the diamond anvil cell (DAC). For the present paper, imaging X-ray photoelectron spectroscopy (XPS ), which is ideally suited for surface chemistry measurements of the small samples required in the DAC, is used. The collection of Bremsstrahlung exci ted Auger electrons in combination with photoelectrons allows for a better comparison of chemical shifts, through the Auger parameter. No dramatic cha nge was observed, as is the case with many alumina polymorphs, but slight d ifferences between the gamma phase and the new high-pressure phase are note d, supporting the earlier X-ray results. Additionally, an extremely low adv entitious carbon level was observed on a gamma -phase sample and is discuss ed. (C) 2000 Elsevier Science Ltd. All rights reserved.