Ag films on GaAs(110): dewetting and void growth

Citation
Mmr. Evans et al., Ag films on GaAs(110): dewetting and void growth, SURF SCI, 465(1-2), 2000, pp. 90-96
Citations number
9
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
SURFACE SCIENCE
ISSN journal
00396028 → ACNP
Volume
465
Issue
1-2
Year of publication
2000
Pages
90 - 96
Database
ISI
SICI code
0039-6028(20001010)465:1-2<90:AFOGDA>2.0.ZU;2-G
Abstract
Scanning tunneling microscopy studies show that atomically flat but slightl y corrugated films of Ag(111) can be produced by depositing similar to 15 A ngstrom of Ag on GaAs(110) at 40 K and then annealing at 300 K. These films are six layers thick. but they also contain voids that extend to the GaAs surface. Time-dependent imaging shows void growth due to spontaneous dewett ing. Void growth is accompanied by the transfer of Ag atoms onto the terrac es where elongated, single-height Ag islands formed, with patterns reflecti ng the corrugation of the Ag film. These results demonstrate that these fil ms are thermodynamically unstable, and they reveal void growth and geometry for a multilayer film. (C) 2000 Elsevier Science B.V. All rights reserved.