The temperature dependence of the DC and AC electrical conductivity were me
asured for Ge1Se1.35Tl0.1 films. The value of DC electrical conduction ener
gy DeltaE(sigma) does not depend on film thickness in the investigated rang
e with mean value of 0.72 eV. The AC conductivity sigma (AC) is related to
frequency by the expression sigma (AC) = A omega (S), where S is the freque
ncy exponent which decreases linearly with increasing temperature. This can
be explained in terms of the pair (bipolaron) correlated barrier hopping m
odel suggested by Elliott. The frequency and temperature dependence of real
and imaginary parts of the dielectric constant were studied for Ge1Se1.35T
l0.1 films. The dielectric constant (real part) and the dielectric loss (im
aginary part) increase with increasing temperature and decrease with increa
sing frequency in the investigated range of frequency and temperature. The
maximum barrier height W-M can be calculated according to the Giuntini equa
tion st different temperatures. The obtained value of W-M is in good agreem
ent with the theory of hopping of charge carriers over a potential barrier
as suggested by Elliott in case of chalcogenide glasses.