C. Hellwig, STRESS-ANALYSIS BY X-RAY-DIFFRACTION - ME ASUREMENT AND EVALUATION PROCEDURES AND THEIR CONTRIBUTION TO THE RESULTS, Materialwissenschaft und Werkstofftechnik, 28(6), 1997, pp. 257-269
The quality of measured results depends not only on the definite accur
acy but also on the expression of the uncertainty of measure ment. Fur
thermore such a statement is recommended for an accredited laboratory.
In the present paper the uncertainty of measurement in residual stres
s analysis by means of x-ray diffraction is investigated for different
samples, different evaluation methods and different data acquisition
strategies. The uncertainties calculated by the computer turned out to
have hardly no validity. The peak evaluation method which yields the
smallest uncertainty was determined. The real uncertainty depends on t
he given problem, on the data acquisition time and on the peak evaluat
ion method. The selection of the different measurement options (number
of psi-angles, step width, number of single measurements, etc.) is of
secondary importance.