GaN one-dimensional materials with different morphologies were formed on La
AlO3 crystal, silicon crystal and quartz glass substrates through a simple
sublimation method. They were characterized by powder X-ray diffraction (XR
D), field-emission scanning electron microscopy (FE-SEM) and energy-dispers
ive X-ray (EDX) spectroscopy. FE-SEM images showed that the morphologies of
the one-dimensional materials included straight nanorods, curved nanowires
, nanoribbons, zigzag nanorods and beaded or capture-tree nanorods. XRD and
EDX studies indicated that all the one-dimensional materials were wurtzite
GaN.