Magnetoresistance of ferromagnetic single-electron transistors

Citation
C. Karlsson et Xh. Wang, Magnetoresistance of ferromagnetic single-electron transistors, APPL PHYS L, 77(22), 2000, pp. 3618-3620
Citations number
19
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
77
Issue
22
Year of publication
2000
Pages
3618 - 3620
Database
ISI
SICI code
0003-6951(20001127)77:22<3618:MOFST>2.0.ZU;2-Y
Abstract
We investigate the magnetoresistance of the single-electron transistor made of ferromagnetic leads and island. By lowering the temperature, the Coulom b blockade of the single electron tunneling is enhanced, which in turn infl uences the magnetoresistance of the device. The corresponding magnetoresist ance ratio as a function of the temperature is studied by taking into accou nt both the spin-dependent tunneling processes and the Coulomb blockade eff ect. Finally, we determine the parameter range, in which the ferromagnetic single-electron transistor can be used as a device with the magnetoresistan ce ratio enhanced by the Coulomb blockade effect. (C) 2000 American Institu te of Physics. [S0003-6951(00)04449-1].