We investigate the magnetoresistance of the single-electron transistor made
of ferromagnetic leads and island. By lowering the temperature, the Coulom
b blockade of the single electron tunneling is enhanced, which in turn infl
uences the magnetoresistance of the device. The corresponding magnetoresist
ance ratio as a function of the temperature is studied by taking into accou
nt both the spin-dependent tunneling processes and the Coulomb blockade eff
ect. Finally, we determine the parameter range, in which the ferromagnetic
single-electron transistor can be used as a device with the magnetoresistan
ce ratio enhanced by the Coulomb blockade effect. (C) 2000 American Institu
te of Physics. [S0003-6951(00)04449-1].