Charge diffusion noise in monocrystalline PbS nanoparticle films

Citation
F. Otten et al., Charge diffusion noise in monocrystalline PbS nanoparticle films, APPL PHYS L, 77(21), 2000, pp. 3421-3422
Citations number
4
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
77
Issue
21
Year of publication
2000
Pages
3421 - 3422
Database
ISI
SICI code
0003-6951(20001120)77:21<3421:CDNIMP>2.0.ZU;2-L
Abstract
Charge transport in monocrystalline lead sulfide (PbS) nanoparticle films i s investigated by current noise measurements. Monocrystalline and single-si zed PbS nanoparticles are synthesized via the gas phase and deposited elect rostatically onto semiconducting (GaAs) and on isolating (SiNx) substrates with planar electrode contacts. The particles form inhomogeneous films. Low -frequency current noise of 1-ML-thick films are measured at various voltag es, exhibiting diffusion noise characteristics, which indicates a random-wa lk (diffusion) phenomenon of electrons between the particles. (C) 2000 Amer ican Institute of Physics. [S0003-6951(00)03747-5].