Differentiating 180 degrees and 90 degrees switching of ferroelectric domains with three-dimensional piezoresponse force microscopy

Citation
A. Roelofs et al., Differentiating 180 degrees and 90 degrees switching of ferroelectric domains with three-dimensional piezoresponse force microscopy, APPL PHYS L, 77(21), 2000, pp. 3444-3446
Citations number
14
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
77
Issue
21
Year of publication
2000
Pages
3444 - 3446
Database
ISI
SICI code
0003-6951(20001120)77:21<3444:D1DA9D>2.0.ZU;2-J
Abstract
Three-dimensional (3D) piezoresponse force microscopy is applied in order t o differentiate 90 degrees and 180 degrees domain switching in PbTiO3 (PTO) thin films. The 3D domain configuration is recorded both statically, revea ling the surface crystallographic orientation of PTO films on the nanometer scale, and dynamically by simultaneously mapping the in-plane and out-of-p lane hysteresis loops. We show that exclusively 180 degrees switching occur s, also switching only half of the grain volume. (C) 2000 American Institut e of Physics. [S0003-6951(00)04647-7].