AN X-RAY SPECTROMICROSCOPIC STUDY OF THE LOCAL-STRUCTURE OF PATTERNEDTITANIUM SILICIDE

Citation
S. Singh et al., AN X-RAY SPECTROMICROSCOPIC STUDY OF THE LOCAL-STRUCTURE OF PATTERNEDTITANIUM SILICIDE, Applied physics letters, 71(1), 1997, pp. 55-57
Citations number
9
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
71
Issue
1
Year of publication
1997
Pages
55 - 57
Database
ISI
SICI code
0003-6951(1997)71:1<55:AXSSOT>2.0.ZU;2-F
Abstract
Results from a spectromicroscopic study of the formation of TiSi2 in p atterned structures are reported. An x-ray spectromicroscope was used to acquire spectra and images with photoabsorption signals using synch rotron radiation. A patterned TiSi2 sample with feature sizes ranging from 100 mu m to 0.1 mu m was studied. The silicidation reactions were carried out in ultrahigh vacuum using rapid thermal processing. Later al variations in the local chemistry of the titanium silicide could be directly imaged and are attributed to the formation of the C54 phase in large areas and the C49 phase at feature edges and in narrow featur es. (C) 1997 American Institute of Physics.