S. Singh et al., AN X-RAY SPECTROMICROSCOPIC STUDY OF THE LOCAL-STRUCTURE OF PATTERNEDTITANIUM SILICIDE, Applied physics letters, 71(1), 1997, pp. 55-57
Results from a spectromicroscopic study of the formation of TiSi2 in p
atterned structures are reported. An x-ray spectromicroscope was used
to acquire spectra and images with photoabsorption signals using synch
rotron radiation. A patterned TiSi2 sample with feature sizes ranging
from 100 mu m to 0.1 mu m was studied. The silicidation reactions were
carried out in ultrahigh vacuum using rapid thermal processing. Later
al variations in the local chemistry of the titanium silicide could be
directly imaged and are attributed to the formation of the C54 phase
in large areas and the C49 phase at feature edges and in narrow featur
es. (C) 1997 American Institute of Physics.