Pulsed-PECVD films from hexamethylcyclotrisiloxane for use as insulating biomaterials

Citation
Hgp. Lewis et al., Pulsed-PECVD films from hexamethylcyclotrisiloxane for use as insulating biomaterials, CHEM MATER, 12(11), 2000, pp. 3488-3494
Citations number
45
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
CHEMISTRY OF MATERIALS
ISSN journal
08974756 → ACNP
Volume
12
Issue
11
Year of publication
2000
Pages
3488 - 3494
Database
ISI
SICI code
0897-4756(200011)12:11<3488:PFFHFU>2.0.ZU;2-1
Abstract
Thin films produced by plasma-enhanced chemical vapor deposition (PECVD) ha ve potential application as conformal coatings on implantable devices with complex topologies and small dimensions. Coatings on such devices need to b e biocompatible, insulating, and flexible enough to minimize static forces on the surrounding tissue. In this study, we describe the use of pulsed-PEC VD to deposit thin films from hexamethylcyclotrisiloxane (D-3) Pulsed-PECVD is a method in which plasma excitation is modulated to favor deposition fr om neutral and radical species. Thin, conformal coatings were demonstrated on nonplanar substrates suitable for implantation, such as copper wires and neural probes. Coatings were resistant to prolonged immersion in warm sali ne solution, and wire coatings produced by pulsed-PECVD showed more flexibi lity than analogous coatings deposited by continuous-wave (CW) excitation. Using Fourier transform infrared spectroscopy, it was demonstrated that the mode of plasma excitation is important in determining film structure. Both CW and pulsed-PECVD showed evidence of cross-linking via ternary and quate rnary silicon atoms bonded to more than two oxygen atoms. Methylene groups were observed only in CW films, and may constitute part of a carbon cross-l inking unit of the form Si(CH2)(n)Si, where n greater than or equal to 1. M ethylene was not detectable in the pulsed-PECVD films, suggesting that form ation of carbon cross-links requires a longer plasma decomposition period. The presence of two distinct cross-linking structures in CW films leads to a highly networked structure and results in brittle coatings on thin wires. A higher proportion of terminal methyl groups was also observed in CW film s, suggesting that pulsed-PECVD films may retain more precursor ring struct ure than CW films.