Scanning tunneling microscopy (STM) measurements of the atomic structure of
metastable pits formed on a Ni( 111) single-crystal surface prepassivated
in a chloride-free sulfuric acid solution and subsequently exposed to chlor
ide above the pitting potential are reported. The STM measurements revealed
pits with a lateral size of 43 +/- 13 nm, a depth of 3 +/- 1 nm, and a den
sity of similar to3 x 10(8) cm(-2), not observable by normal current transi
ent measurements. The atomic structure observed inside the pits was crystal
line, with the same symmetry and parameters as the crystalline structure of
the passivated surface prior to exposure to chloride. This structure was a
lso observed in the nonpitted areas exposed to chloride. The location of th
e pits at the grain boundaries of the crystalline structure of the passive
film and their preferential elongation in the direction of the substrate te
rraces show the deterministic role of the passive film structure and substr
ate structure in pit initiation. (C) 2000 The Electrochemical Society. S109
9-0062(00)07-072-3. All rights reserved.