A SIMPLE TECHNIQUE FOR MEASURING THE ADHESION OF BRITTLE FILMS TO DUCTILE SUBSTRATES WITH APPLICATION TO DIAMOND-COATED TITANIUM

Citation
Jj. Vlassak et al., A SIMPLE TECHNIQUE FOR MEASURING THE ADHESION OF BRITTLE FILMS TO DUCTILE SUBSTRATES WITH APPLICATION TO DIAMOND-COATED TITANIUM, Journal of materials research, 12(7), 1997, pp. 1900-1910
Citations number
28
Categorie Soggetti
Material Science
ISSN journal
08842914
Volume
12
Issue
7
Year of publication
1997
Pages
1900 - 1910
Database
ISI
SICI code
0884-2914(1997)12:7<1900:ASTFMT>2.0.ZU;2-T
Abstract
We have developed a new technique for measuring the adhesion of brittl e films to ductile substrates. In this technique, a wedge indenter is driven through the brittle coating and into the underlying substrate. Plastic deformation of the substrate causes the coating to delaminate from the substrate. The width of the delaminated area can be directly related to the interface toughness. We present a simple analysis of th is technique and apply it to diamond-coated titanium. The toughness of the diamond-titanium interface as measured with this wedge delaminati on technique is approximately 51 +/- 11 J/m(2). XPS measurements revea l that a reaction layer of titanium carbide forms between the diamond coating and the titanium substrate. Delamination of the coating occurs by crack propagation in this reaction layer and in the diamond film i tself. These observations agree well with nanoindentation measurements performed in the delaminated area of the substrate.