Hardness of oxide films formed as a result of aluminium anode oxidation processes

Citation
M. Chis et al., Hardness of oxide films formed as a result of aluminium anode oxidation processes, J APPL CRYS, 33, 2000, pp. 1360-1364
Citations number
29
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF APPLIED CRYSTALLOGRAPHY
ISSN journal
00218898 → ACNP
Volume
33
Year of publication
2000
Part
6
Pages
1360 - 1364
Database
ISI
SICI code
0021-8898(200012)33:<1360:HOOFFA>2.0.ZU;2-2
Abstract
Factors that influence the anode oxidation processes of aluminium and its a lloys are discussed. The main parameters involved in such processes have be en selected and subjected to measurement under controlled experimental cond itions. The effects of the variation of the chemical, electrical and therma l parameters of the aluminium anode oxidation process on the hardness level of the resulting oxide layer have been studied. In order to quantify the r elationships that govern the kinetics of the anode oxidation process, these data were subjected to analysis employing a central compositional rotatory programming matrix. Parameters employed were electrolyte concentration, te mperature, current density and immersion time of the product in the electro lyte to achieve a desired oxide layer. The hardness of the resulting oxide layers is discussed.