Kinematical two-dimensional multiple-diffraction intensity profiles. Application to omega-psi scans obtained with CuK alpha radiation

Authors
Citation
E. Rossmanith, Kinematical two-dimensional multiple-diffraction intensity profiles. Application to omega-psi scans obtained with CuK alpha radiation, J APPL CRYS, 33, 2000, pp. 1405-1414
Citations number
9
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF APPLIED CRYSTALLOGRAPHY
ISSN journal
00218898 → ACNP
Volume
33
Year of publication
2000
Part
6
Pages
1405 - 1414
Database
ISI
SICI code
0021-8898(200012)33:<1405:KTMIPA>2.0.ZU;2-G
Abstract
Expressions for the calculation of multiple-diffraction patterns observed i n omega-psi scans of Bragg reflections are derived within the framework of the kinematical theory, taking into account the divergence and wavelength-s pread of the incident beam as well as the mosaicity of the crystal sample. The theoretical results can be applied to X-ray tube radiation as well as s ynchrotron radiation experiments. A 189.9 degrees experimental Cu K alpha ( 2) over bar(2) over bar(2) over bar omega-psi scan of diamond is compared w ith the corresponding theoretical multiple-diffraction pattern.